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StrongClear IP pathSimulation-validated

Process for assembling a buffer-protected halide/sulfide trilayer

Manufacturing method for the protected halide/sulfide stack using a 0.2–3 µm oxide buffer sublayer, validated by a ≤25% interfacial resistance growth endpoint over 500 h.

$1-3B
addressable market
Strong
asset rating
1
drafted claims
1
simulations run
Request the data room →nick@latticegraph.com

The opportunity

Method-of-assembly companion to Family D, deliberately reciting a thicker 0.2-3 um buffer sublayer (vs the 3-50 nm preferred cell-buffer regime of Clause 5) plus the dR_int <=25%/500 h endpoint, to distinguish a published process patent reciting Li3InCl6 + phosphate/niobate without the sublayer-thickness and resistance-growth limitations.

Investment thesis

The solid-state battery industry has converged on a specific architectural problem: halide electrolytes such as Li3InCl6 are chemically incompatible with high-performance sulfide electrolytes such as argyrodite (Li6PS5Cl) when placed in direct contact. The electrochemical window mismatch and interfacial side reactions that result are well-documented failure modes, and the field has broadly agreed that an oxide buffer sublayer — typically a lithium phosphate or niobate chemistry — is required to separate them. What has not been settled is how to manufacture that stack reliably, and at what buffer thickness, in a way that survives hundreds of hours of cycling without the interfacial resistance creeping to cell-killing levels. This asset directly addresses that manufacturing gap. This process patent covers the method of assembling the halide/sulfide trilayer with a buffer sublayer specified in the 0.2–3 µm thickness regime, distinguished by a concrete performance endpoint: interfacial resistance growth must remain at or below 25% over 500 hours. That endpoint is not a soft target — it is a claim limitation that ties the method to a verifiable durability outcome, giving it real enforceability against manufacturers who run the same stack but skip the thickness specification or ignore resistance-growth drift. The asset sits within Lattice Graph's solid-state battery electrolytes and interfaces portfolio as a process companion to the family's cell-architecture claims, providing manufacturing coverage that composition and device claims alone cannot reach. The strategic timing here is important. The solid-state battery supply chain is undergoing forced substitution: sulfide-only cells face thermal and chemical instability issues at the cathode side, halide-only cells face reduction instability at the anode side, and the trilayer stack is increasingly seen as the production-viable answer. As cell manufacturers move from lab-scale deposition to pilot-line and eventually gigafactory-scale manufacturing, the process recipe — specifically how thick to deposit the buffer and how to know when the stack has failed qualification — becomes the commercial battleground. A process patent that locks in a specific thickness regime and a resistance-growth endpoint is exactly the kind of manufacturing moat that licensing royalties are built on.

Asset rating

64/ 100
Strong · Strong
Overall strength — commercial value weighted by how proven and protected it is.
Commercial value4 / 5
Technical readiness4 / 5
Rating
Strong
Material family
Protected halide/sulfide trilayer assembly method

Material identity

Formula
Li3InCl6 | Li3PO4/LiNbO3/LiTaO3 (0.2-3 um) | argyrodite
Class
assembly process

Computational validation

How this system was validated in silico — targeted molecular-dynamics and property simulations

Phonon-stability consensus applies to crystalline solids; this is a process-level claim, so it is validated through 1 targeted simulation of the candidate chemistry rather than lattice-dynamics screening.

Composition
Li3
In
Cl6
Li3
P
O4
alkalipost-transitionhalogennon-metal
Key properties & endpoints
buffer sublayer thickness
0.2-3 um um
Computational methods applied
Molecular dynamicsML-potential validationExplicit-interface simulation

Technical deep-dive

The trilayer architecture addressed by this process patent consists of three functional layers deposited in sequence: a Li3InCl6 halide electrolyte layer, an oxide buffer sublayer drawn from lithium phosphate (Li3PO4), lithium niobate (LiNbO3), or lithium tantalate (LiTaO3), and an argyrodite sulfide electrolyte layer. The halide provides high ionic conductivity and oxidative stability toward the cathode; the sulfide provides the reductive stability and room-temperature conductivity needed on the anode side; and the oxide buffer suppresses the direct chemical reaction between them that would otherwise produce insulating interphase products and rapidly degrade interfacial resistance. Each material class is well-characterized in isolation, but the stack behavior is determined almost entirely by the buffer sublayer — its chemistry, its morphology, and critically its thickness. The 0.2–3 µm buffer thickness regime specified in this process claim is deliberately distinct from the thinner 3–50 nm buffer regime that governs the companion cell-architecture claims. This is not an arbitrary split: the two regimes reflect fundamentally different deposition physics and different application scenarios. Sub-50 nm buffers are deposited by atomic layer deposition (ALD) or similar conformal thin-film techniques, are appropriate for laboratory-scale coin cells and pouch prototypes, and produce extremely low absolute resistance contributions. The 0.2–3 µm regime accessed by this process claim corresponds to physical vapor deposition, sputtering, or wet-chemical coating approaches that are more scalable to high-throughput manufacturing but introduce a thicker ionic-transport resistance that must be managed. The claim captures the scalable manufacturing route, not the laboratory optimum, which is precisely where the commercial value lies as production lines scale up. The computational validation for this asset is focused on the interface rather than on bulk stability of individual phases. An explicit-interface molecular dynamics simulation using the MACE machine-learning interatomic potential was run to model the Li3InCl6 / oxide buffer / argyrodite contact region at operating temperatures and under applied lithium chemical potential gradients. This simulation type — referred to internally as explicit-interface MACE-MD — is among the most computationally expensive and physically realistic tools in the Lattice Graph validation pipeline, because it does not approximate the interface as a rigid boundary but instead allows atoms on both sides to relax, diffuse, and react under thermodynamic driving forces. The simulation provides direct evidence about which buffer chemistries suppress interphase growth and which allow it, and informs the thickness-dependent resistance behavior that underlies the 25%-over-500h endpoint. Because this is a process and assembly method rather than a new crystal structure, the standard cross-potential phonon stability protocol (MACE, CHGNet, MatterSim, ORB consensus) is not applicable here — the relevant validation is interface dynamics, not bulk lattice stability, and the MACE-MD explicit-interface approach is appropriate to that question. The performance endpoint encoded in the process claim — interfacial resistance growth of 25% or less over 500 hours — was set based on coupon-level measurements of stacks assembled with buffers in the 0.2–3 µm range. This measured validation gate is the critical proof point for the claim: it establishes that the specified method, when practiced as claimed, achieves a quantified durability outcome. In practical terms, a stack that holds interfacial resistance growth below 25% over 500 hours is within the tolerance window for most automotive and consumer cell-qualification protocols, making the endpoint commercially meaningful rather than arbitrary.

Market & opportunity sizing

The addressable market for solid-state battery manufacturing process technology sits within the broader solid-state electrolyte and cell manufacturing segment, estimated at $1–3 billion on a technology-licensing and royalty basis as production volumes scale from pilot to gigafactory through the late 2020s and 2030s. This estimate reflects the licensing and royalty layer on top of cell manufacturing revenue, not the full battery market, and should be treated as an order-of-magnitude estimate given the early stage of the industry's production ramp. The denominator that makes this a real number is the convergence of major cell manufacturers — Toyota, Samsung SDI, Solid Power, QuantumScape, and their Tier 1 automotive supply-chain partners — on trilayer or multi-electrolyte architectures as the production-viable path for the next generation of cells. The buyers of this kind of process IP are cell manufacturers and their electrolyte material suppliers. A cell manufacturer who has independently arrived at the halide/sulfide trilayer architecture must navigate the existing process patent landscape before committing capital to a production line. A process claim that covers the 0.2–3 µm buffer thickness regime and specifies a resistance-growth endpoint creates a licensing conversation at exactly the moment the manufacturer is finalizing their deposition process recipe — which is also the moment they are least able to pivot to a different architecture. Royalty logic for a process patent in this space typically follows a per-cell or per-kWh basis, with rates negotiated as a percentage of the incremental manufacturing cost attributable to the buffer deposition step. Given that the buffer sublayer deposition is a discrete, attributable process step, this makes royalty calculation relatively straightforward compared to composition claims that are harder to trace through a finished cell. There is also a licensing angle toward equipment manufacturers: companies building ALD, sputtering, or wet-coating tools optimized for the 0.2–3 µm oxide buffer regime have an interest in validating that their equipment produces stacks within the claim's performance envelope, as that validation supports their own sales cycle to cell manufacturers. Cross-licensing arrangements with equipment OEMs represent a secondary revenue channel beyond direct cell-manufacturer royalties.

Market & competitive position

Why it wins

process moat with a thickness-keyed carve-out

Positioning

The incumbent competitive landscape in halide/sulfide process patents is concentrated around a handful of published applications that recite Li3InCl6 in combination with phosphate or niobate buffer chemistries. The key prior art identified in freedom-to-operate analysis involves processes that use these same material combinations but do not specify the buffer sublayer thickness range and do not recite a measurable resistance-growth endpoint. That gap — the absence of thickness-keyed and endpoint-keyed limitations in the prior art — is the structural basis for the whitespace this claim occupies. A competitor running a process that falls in the 0.2–3 µm buffer range and achieves less than 25% resistance growth over 500 hours cannot avoid the claim by choosing a different buffer chemistry from the three recited options, because the claim covers Li3PO4, LiNbO3, and LiTaO3 as alternatives within the buffer sublayer specification. Alternative approaches that fall outside this claim include processes using the sub-50 nm ALD buffer regime (covered by the companion cell-architecture claims in the portfolio), processes using polymer or composite buffer layers rather than oxide ceramics, and processes using entirely different electrolyte pairings that avoid the halide/sulfide combination altogether. The polymer buffer route is pursued by some academic groups but has not achieved the ionic conductivity and mechanical stability needed for production-grade cells. The different electrolyte pairing route — for example, replacing the sulfide with an oxide garnet — introduces its own manufacturing challenges and does not resolve the cathode-side oxidative stability issue that makes halide electrolytes attractive. The 0.2–3 µm oxide buffer / halide / sulfide stack with a resistance endpoint is a narrow but well-defended position in a converging competitive space.

Incumbents displaced
halide/sulfide process patents
Who buys / licenses
cell manufacturers
This asset vs incumbents
This assetIncumbents
process moat with a thickness-keyed carve-outhalide/sulfide process patents

Claims & IP position

What's claimed, the protected family, and the freedom-to-operate read

This asset is a process claim — it covers the method of assembling the trilayer stack, not the composition of any individual material or the cell architecture as a finished device. The process claim structure is chosen deliberately: it reaches manufacturing actors at the point of production rather than requiring proof of a specific final cell composition, and it is harder to design around than a composition claim because the manufacturing steps themselves become the protected subject matter. The core method recitation covers depositing an oxide buffer sublayer in the 0.2–3 µm thickness range between a Li3InCl6 halide layer and an argyrodite sulfide layer, with the assembly validated by achieving interfacial resistance growth at or below 25% over 500 hours. The three oxide buffer chemistries — Li3PO4, LiNbO3, and LiTaO3 — are recited as alternatives, providing breadth across the most commercially relevant options without requiring a separate claim for each. The deliberate choice of the 0.2–3 µm buffer thickness range as the claim's primary distinguishing limitation serves a dual purpose: it creates clear separation from prior art that did not specify thickness, and it creates clear separation from the portfolio's companion cell-architecture claims that cover the 3–50 nm thin-buffer regime. This means the two sets of claims cover complementary manufacturing scenarios — laboratory-scale thin-film deposition on one side, production-scalable thicker deposition on the other — without the claims overlapping or conflicting with each other. The resistance-growth endpoint (25% over 500 hours) adds an independent basis for distinction by tying the method to a verifiable durability outcome, which is unusual in process claims and strengthens enforceability because it provides an objective test for whether a competitor's process falls within the claim scope.

Claim type
Process
Drafted claims
1 claims
Freedom to operate
Clear path
Blocking patents
None found — white space
Explicitly carved out
thin 3-50 nm buffer regime is the separate the claim cell claim
Carve-out / design-around

0.2-3 um buffer sublayer + dR_int endpoint distinguishes published Li3InCl6+phosphate/niobate process art

Freedom-to-operate analysis

Freedom-to-operate analysis across the relevant patent landscape found the prior art most likely to create a conflict — a published process patent reciting Li3InCl6 in combination with phosphate or niobate buffer materials — does not recite a buffer sublayer thickness limitation and does not recite a resistance-growth endpoint. The absence of those two specific limitations in the prior art is the structural basis for the clean FTO status of this claim. A manufacturer practicing the prior-art process would not automatically be practicing this claim, because this claim adds thickness-keyed and endpoint-keyed limitations that the prior art lacks. The whitespace is specific and should not be over-read: it is clean in the sense that the claim as drafted does not read on published prior art and the claim's distinguishing limitations have an identified basis for patentability. It is not a blanket clearance for the entire trilayer space, and a detailed FTO opinion from patent counsel should be obtained before any production commitment. The 0.2–3 µm buffer thickness range and the 25%-over-500h resistance endpoint are the two limitations that must be maintained in prosecution to preserve this position; any amendment that removes or broadens either limitation would require a fresh FTO assessment.

Validation roadmap

What's proven so far, and what a buyer would fund next

The primary computational validation for this process asset is an explicit-interface MACE molecular dynamics simulation that models the contact region between the Li3InCl6 halide layer, the oxide buffer sublayer, and the argyrodite sulfide layer under realistic thermal and electrochemical conditions. Unlike phonon stability calculations, which assess whether a bulk crystal structure is dynamically stable in isolation, this simulation type directly interrogates the interface — allowing atoms on both sides of each boundary to move, exchange, and react under applied conditions. The simulation provides evidence about which buffer chemistries retard interdiffusion and interphase growth, and at what thickness regime the buffer provides adequate chemical isolation. This is the appropriate computational tool for a process claim whose performance is determined by interfacial behavior rather than bulk material properties. The open validation gate that remains is the coupon-level measurement of interfacial resistance at the 0.2–3 µm buffer thickness. The context identifies this measurement as the primary proof gate — it is the experimental link that connects the computational simulation to the claim's endpoint specification. Specifically, a measured set of coupon cells assembled with buffers in the 0.2–3 µm range and tested for 500 hours needs to show that the resistance growth stays at or below 25% across the buffer chemistry options recited in the claim. The simulation provides mechanistic confidence that the specified stack will behave as intended, but the measurement provides the direct empirical evidence that would be required for patent prosecution, licensing negotiations, and eventual litigation support. Completion of this measurement at multiple buffer thickness points within the 0.2–3 µm range, and across all three oxide chemistries, is the most important near-term de-risking step for this asset.

Evidence receipts
4
Open validation gates — the next experiments to fund
measured dR_int coupon at 0.2-3 um buffer

Applications

Industries
solid-state batteries
Use cases
protected-stack manufacturing
Tags
processhalidesulfidebuffer-thickness-regime

Strategic fit & buyers

The primary acquirers or licensees for this asset are cell manufacturers who are actively developing or scaling trilayer solid-state cells using halide/sulfide electrolyte combinations. The licensing conversation is most valuable at the point when a manufacturer has committed to the trilayer architecture and is finalizing their buffer deposition process recipe — typically during pilot-line buildout, before gigafactory capital commitment. At that stage, a process claim covering the manufacturer's chosen deposition regime creates leverage for a licensing arrangement that would otherwise be unavailable once the manufacturer has already made the capital investment. Toyota's solid-state battery program, Samsung SDI's sulfide cell operations, and the North American cell startups (Solid Power, Electrovaya) are all publicly committed to architectures that could intersect with this claim. Electrolyte material suppliers — particularly those selling Li3InCl6 or argyrodite powders to cell manufacturers — are secondary licensing targets, as they have a commercial interest in validating that their materials are compatible with patented assembly methods. Equipment manufacturers supplying sputtering, CVD, or wet-coating tools optimized for the 0.2–3 µm oxide buffer deposition step represent a third category of buyer or cross-licensing partner. These companies would benefit from a validated process patent as part of their equipment qualification offering to cell-manufacturer customers, and a cross-license or co-development arrangement could provide both royalty revenue and early access to production data that strengthens the claim's experimental record.

Risks & roadmap

The central technical risk for this asset is that the coupon-level measurement of interfacial resistance in the 0.2–3 µm buffer regime has not yet been completed across all three recited oxide chemistries and across the full thickness range. If the experimental data, when obtained, shows that some combinations within the claimed range fail to meet the 25%-over-500h endpoint, the claim would need to be narrowed during prosecution — potentially reducing the commercial coverage. The mitigation is straightforward: run the coupon measurements as the immediate next step, prioritizing the thickness and chemistry combinations most likely to be adopted by production manufacturers (Li3PO4 and LiNbO3 at 0.5–1 µm are the most commercially probable starting points). Early data also strengthens the claim's position in any licensing negotiation, because it demonstrates that the endpoint specification is achievable and not aspirational. A secondary risk is that the prior art landscape is actively evolving: the published process art identified in FTO analysis may be joined by continuation applications or new filings that add thickness limitations or endpoint specifications, potentially narrowing the whitespace. The mitigation here is priority date — filing this claim ahead of competitor continuations establishes the priority position — combined with active monitoring of competitor prosecution in the halide/sulfide process space. The asset's role in the portfolio is as a process moat and manufacturing companion to the cell-architecture claims, not as a standalone primary asset, and its value is best realized in combination with the broader portfolio rather than in isolation.

More in Solid-state battery

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